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X-ray Photoelectron Spectroscopy: An introduction to Principles and Practices | Wiley
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Secondary Ion Mass Spectrometry - By Paul Van Der Heide (hardcover) : Target
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Cider Association Elects 2018 Board of Directors Welcomes Paul Vander Heide of Michigan as New President | Vander Mill
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imec magazine January 208 - Paul van der Heide on transistor metrology
125: Prez. Vander Heide | USACM & Vander Mill
Material characterization to support semiconductor device fabrication | imec
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Episode #34: Paul Vander Heide of Vander Mill - YouTube
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imec magazine January 208 - Paul van der Heide on transistor metrology
Q&A: Paul Vander Heide, Owner of Vander Mill LLC
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